• 저자Seongje Chae,Won-Kwang Park,안치영
• 학술지Electronics (2079-9292), 9(119), 1119 ~ -
• 등재유형SCIE
• 게재일자 20200710

We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters.