• AuthorSeongje Chae,Won-Kwang Park,안치영
• JournalElectronics (2079-9292), 9(119), 1119 ~ -
• Enrollment typeSCIE
• publication date 20200710

We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters.